Yield Management System
✔ Web-based architecture allowing multiple users to remotely log in and access the system simultaneously via the network domain, enabling them to grasp production status anytime, anywhere.
✔ Production history data statistical report output.
✔ Real-time status monitoring of defects during equipment production.
✔ Integration of defect map overlay and defect type code identification functions.
✔ Ability to collect AOI defect image data for offline defect observation and measurement.
✔ Integration with AI for big data analysis and feedback to production equipment for early warning of production anomalies.
✔ Manual judgment and classification of defects by personnel.
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Applied Field
Semiconductor Industry
Panel Industry
Printed Circuit Board (PCB) Industry
Features
Combining years of experience in the AOI industry and defect detection/metrology, FAVITE has developed the YMS Yield Management System. Addressing real customer needs, it integrates massive amounts of AOI data to build a complete product production history. The simple and easy-to-use user interface allows managers to grasp product quality at any time. Through real-time monitoring and analysis tools, it quickly identifies the root causes of process anomalies and implements improvements.
Features:
✔ Web-based architecture allowing multiple users to remotely log in and access the system simultaneously via the network domain, enabling them to grasp production status anytime, anywhere.
✔ Production history data statistical report output.
✔ Real-time status monitoring of defects during equipment production.
✔ Integration of defect map overlay and defect type code identification functions.
✔ Ability to collect AOI defect image data for offline defect observation and measurement.
✔ Integration with AI for big data analysis and feedback to production equipment for early warning of production anomalies.
✔ Manual judgment and classification of defects by personnel.
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